High-Speed Laser Diode Test System
The system is based on PXI technology to be flexible for all future demands.
Application Examples
Single shot – researching of single pulse behaviour
Production testing of laser diodes
- Very short pulses down to 2 µs
- Pulse current up to 250 mA
- 3 current generator ranges for a
maximum variety of test scenarios - Independent support for 2 photo sensors
- 4 photo-current measurement ranges
- Programmable bias voltage
The LTS8620 Laser Diode Test System is an integrated PXI test system
for easy characterizing and testing of laser diodes in laboratory and
production. The LTS8620 benefits from a space-saving 12-slot design
with only 2 rack-units (U) in height.
An adapter box is included to shorten the distrance between the Device Under Test (DUT) and the sensible measurement circuits.
An adapter box is included to shorten the distrance between the Device Under Test (DUT) and the sensible measurement circuits.
