这里您可以找到我公司目前的白皮书和应用手册,这些文档一般有德文版本和英文版本。一部分应用手册只有英文版本。
Once the appropriate measurement procedure has been selected and the test setup is determined, it is to select the instrument: oscilloscope, digitizer or DMM. We give tips on the selection of devices.
Static measurements (DC) for isolated and non-isolated measuring equipment may result in measurement inaccuracies. We will show the possible reasons for this.
If you are working in measurement technology, you cannot avoid measurement errors and measurement inaccuracies. In our whitepaper we show the effects of errors in the case of dynamic AC measurement.
This whitepaper provides an example that shows how you can work around problems by calculating for testing the RDS(on) static on-resistance parameter of a MOSFET.