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  • PXI - PXIe - PCIe

  • VXI

  • 19"

  • Custom

  • Waveform Digitizer / Scope

  • Waveform Generator

  • High Power SMU

  • Source & Measurement

  • Source only

  • Measurement only

  • Other & Periphery


PXD(e)721x High Resolution Waveform Digitizer Family


  • Based on VX Instruments FlexCPeP
  • Input voltage up to 120Vpp
  • 100MS/s with 16Bit resolution
  • Available as isolated and nonisolated version
  • Up to 100MHz bandwidth
  • Multiple instrument and channel synchronization possibilities
  • Built-in DVM function for high precision measurement (option DVM)
  • Built-in timer/counter engine for high speed timer/counter (option T/C)

Product Information

Flexible Configurable PXIe Platform
This family of Waveform Digitizers is based on the "Flexible Configurable PXIe Platform" (FlexCPeP). This platform allows many variations of customer configured digitizers.

High speed, high resolution Waveform Digitizer
The PXD(e)721x High Resolution Digitizer- Family features up to two 100MS/s simultaneously sampled input channels with 16 Bit resolution, input voltages up to ±60V and a bandwidth of 50MHz (100MHz with option DBW).
Every digitizer channel has its own 2MB memory which allows up to 1 million samples. Depending on the amount of channels and the isolated option, the digitizers are built into a compact 3U PXI device for 1 or 2 slots. All isolated devices have a high common mode rejection ratio (CMRR). A great number of trigger capabilities results in multiple instrument and channel synchronization possibilities.
Data can be acquired before and after the trigger event with a programmable sample counter, that controls the number of data points.

High input voltage range allows easy measurement
The maximum voltage for each signal input is ±60V. This allows high voltage signals to be measured without additional signal conditioning.

High troughput design for many applications
The PXD(e)721x Digitizer Family is designed for high throughput testing. Multiple measurements in combination with the memory segmenting feature (option MEMSEG) results in additional test time improvement. This design guarantees highest quality measurements and is ideal for a wide range of application areas including automotive, communications, scientific applications, military/aerospace and consumer electronics.