High-Speed Laser Diode Test System

Light-Current-Voltage (LIV) characteristics
Single shot – researching of single pulse behavior
Production testing of laser diodes

  • Very short pulses down to 2 μs
  • Pulse current up to 250 mA
  • 3 current generator ranges for a
    maximum variety of test scenarios
  • Independent support for 2 photo sensors
  • 4 photo-current measurement ranges
  • Programmable bias voltage
The LTS8620 Laser Diode Test System is an integrated PXI test system for easy characterizing and testing of laser diodes in laboratory and production. Additionally, the system features a space saving 12-Slot design with only 2 height units.
In addition, only the adapter box LTA8601 is needed to realize a very short distance between the Device Under Test (DUT) and the sensible measurement circuits.
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