AXS844x Multichannel Source Measurement Unit

Run tests simultaneously on 4 channels with up to 400 V. Carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for direct testing of high-voltage RGBW LEDs
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  • 2 channels with 400 WDC each or 1 channel and 800 WDC
  • Output current up to 100 A
  • Output voltage up to 400 VDC
  • Up to 4 independent channels with 200 WDC each
  • Extremely low noise with linear output stage
  • Completely isoltated instrument
  • Very fast rise and fall times
  • Programmable current pulse
  • Integrated current (CMU) and voltage measurement unit (VMU)
  • Trigger in- and outputs
The potential-free multi-channel SMUs of the AXS family can output regulated DC voltages or voltage pulses in the range from -50 to +400 V. The signal curve is very linear and is characterized by very short rise and fall times. The extremely fast regulation prevents the output signal from overshooting, which enormously shortens test times.

Functions such as the start of a pulse can be activated by hardware triggers and thus guarantee very short response times.

With the integrated switching matrix, the individual functional units (generator, VMU and CMU) can be flexibly connected to the test items. This means that basically three different devices are available for each channel. Complex test scenarios can thus be implemented with just one device. A wide range of switching options are available to the user via additional I/Os for controlling external relays.
Ordering Information Comment
AXS8441 1 channel output
AXS8442 1 or 2 channel output
AXS8444 1, 2 or 4 channel output
Option EXTVOLT Extended output voltage range
Option PCG Primary current generator
Option GPIB GPIB interface
Option USB USB 2.0 interface
Option LAN Ethernet interface
Option EPCIE External PCIe interface
Option FE Front touch display
Option ECR-L Extended current ranges L
Option ECR-H Extended current ranges H
Option RMK 19" rack mounting kit

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Whitepaper - Cost down und System-Vereinfachung 1000 A High Current RDS(on) Static Parameter DC-Tests vs. Puls-Tests @ 300 μs Whitepaper Cost-reduction and Simplification: 1000 A High Current RDS(on) static parameter DC testing vs. pulse testing @ 300 μs Download
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