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The DTS8765neo is a dynamic test system for power semiconductors such as MOSFETs, and IGBTs, and supports a comprehensive range of dynamic Safe Operating Area (SOA) tests as well as all standard tests according to IEC 60747-7, -8, and -9.
DTS8765neo features outstanding performance characteristics:
- Up to 2,000 V / 20,000 A /li>
- Short test times < 500 ms
- Very low parasitic inductance down to 5 nH
Further benefits:
- Expandable for static AND dynamic tests on one test system
- Flexible and modular expandability for all functionalities
- Easy operation: Can be operated by general production personnel
- Compact footprint
- Handler independent: Short integration times for new DUTs and machine suppliers
- Cost efficient: Best price/performance ratio
Further exciting highlights at our booth:
- Our innovative static parameter power semiconductor test system STS8760neo, which enables particularly fast, parallel multi-station and multi-site testing
- The high-voltage SMU AXV7680, which offers output voltages of up to 10 kV
- Our reliable PXI instruments for all your measurement and testing challenges