High Current & High Voltage Source Measurement Units
Power Semiconductors have a high demand on the test equipment regarding the testing parameters. Our equipment is designed for the high speed production test for power semiconductors. Take a look at our product specifications and our whitepaper. Should you have any questions, our technical support team is glad to help you with your test application setup.
High Current RDS(ON)
and Forward Voltage Measurement
AXC7592
- Output current pulses up to 2400 A
- Output voltage up to 50 V
- Pulse width from 300 µs
- Extremely low noise with
linear output stage - Integrated current measurement unit
- Integrated voltage measurement unit
Drain-Source & Collector-Emitter Leakage Measurement
AXV7607
- Output voltage from -1500 V to 2500 V
- Output current pulses ±30 mA
- Continuous Output current ±8 mA
- Very fast rise and fall times
- Integrated voltage & current measurement unit
- Integrated voltage & current monitor
Gate-Leakage & Gate-Threshold Measurement
AXS7720
- Fully isolated design
- Fast measurement of current in nA range
- Fast rise and fall times due to integrated sink capability
- Integrated matrix and digital I/Os
- Autosensing
- Digital calibration
Further Resources
Whitepaper
Cost-reduction and simplification: 1000 A high current RDS(on) static parameter DC testing vs. pulse testing @ 300 μs
The need for high-power semiconductors like diodes, MOSFETs, or IGBTs is increasing rapidly. All areas of renewable energy, e-mobility, or industrial electronic drives have a strongly growing need for more powerful components. Testing these components is a big challenge for test engineers. Read more about this topic in our whitepaper.
